Djamiykov, Todor; Джамийков, Тодор Стоянов
Designing an optoelectronic characterization system for an educational laboratory
2008
Proceedings of the Technical University – Sofia, 58(2), 2008, pp. 99-104
Технически университет - София
1311-0829 [issn]
Article
eng
data acquisition, I-V characteristics, optoelectronic, parametric measure unit, virtual instrumentation
This paper describes a simple, cost-effective parameter analysis system, built of low-cost data acquisition module, easily obtainable components and programmed using a graphical programming environment. The system is designed for educational purpose and can be used for static characterization of ptoelectronic devices, sensors and other semiconductors. In the presented paper is considered some topics concerning the connectivity between data acquisition board and integrated parametric measure unit. Such considerations are important in order to achieve accurate I-V characteristics of investigated optoelectronic devices. The designed system’s hardware is powerful and capable of performing a more of the tests required for the laboratory experiments.
Reviewer prof. Marin Marinov. - Formulas, schemes - References, pp. 104